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王硕,王宗,孙容,张若飞,李伟杰,丛熙,聂志华,仇巍,富东慧*.基于掠入射二维X射线衍射的陶瓷应力实验表征方法[J].实验力学,2024,39(5):580~589
基于掠入射二维X射线衍射的陶瓷应力实验表征方法
A method for analyzing the stress of ceramic material based on grazing incidence two-dimensional X-ray diffraction
投稿时间:2024-02-27  修订日期:2024-04-07
DOI:10.7520/1001-4888-24-036
中文关键词:  掠入射二维X射线衍射  陶瓷材料  实验应力分析  低衍射角衍射环
英文关键词:grazing incidence two-dimensional X-ray diffraction (GI-XRD2)  ceramic material  experimental stress analysis  diffraction rings at low diffraction angles
基金项目:国家自然科学基金项目(12125203, 12021002, 12041201)
作者单位
王硕 天津大学 机械工程学院力学系 天津 300354 
王宗 天津大学 机械工程学院力学系 天津 300354 
孙容 天津大学 机械工程学院力学系 天津 300354 
张若飞 天津大学 机械工程学院力学系 天津 300354 
李伟杰 天津大学 机械工程学院力学系 天津 300354 
丛熙 天津大学 机械工程学院力学系 天津 300354 
聂志华 北京理工大学 材料学院 北京 100081 
仇巍 1.天津大学 机械工程学院力学系 天津 300354 2.天津市现代工程力学重点实验室 天津 300354 
富东慧* 1.天津大学 机械工程学院力学系 天津 300354 2.天津市现代工程力学重点实验室 天津 300354 
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中文摘要:
      陶瓷材料被广泛应用于航空航天关键部件的防护涂层以及功率半导体的封装材料。陶瓷材料在服役过程中受环境因素的影响会产生较大的残余应力,这是其破坏失效的主要原因。因此,发展适用于陶瓷材料应力的无损检测方法对其服役安全具有重要意义。X射线衍射 (XRD) 技术是一种无损、高精度的应力测试方法,在分析材料失效和优化制备工艺方面具有重要作用。然而,目前常用的X射线衍射应力分析方法和装置难以满足陶瓷材料应力快速且精准的测量需求。为此,本文提出了一种基于掠入射二维X射线衍射 (GI-XRD2) 原理,采用低衍射角衍射环单次曝光的二维X射线衍射应力快速表征方法,并搭建了前向衍射的实验装置。本文基于大气等离子喷涂(APS)技术制备了8wt.%Y2O3稳定ZrO2(8YSZ)陶瓷样品,通过实验验证了提出方法的有效性、适用性,并分析了其在兼容性、效率、灵敏度等方面相比当前其他相关方法与仪器的特点与优势。
英文摘要:
      Ceramic materials are widely used as protective coatings for critical components in aerospace, as well as packaging materials for power semiconductors. However, residual stress caused by environmental factors during the services of the ceramic components is the main reason for structural failure. Therefore, the development of the non-destructive testing method for the stress analysis is of great significance to the service safety of ceramic material. X-ray diffraction (XRD) is a non-destructive and high-precision technique of experimental stress analysis. However, existing XRD methods and devices for stress analysis are difficult to meet the demand for rapid and accurate detection of stress in ceramic materials. This work proposed a grazing incidence two-dimensional X-ray diffraction (GI-XRD2) method, which analyzed the surficial stress of ceramic material by detecting diffraction rings at low diffraction angles with only a single exposure. Based on the above method, an GI-XRD2 instrument was established. The experiments in this paper, using 8wt.% Y2O3 stabilized ZrO2 (8YSZ) ceramics prepared by the atmospheric plasma spraying (APS) technique as samples, verified the validity and applicability of the proposed method. Then, its advantages in compatibility, efficiency, and sensitivity were discussed by comparing it with other relevant methods and instruments.
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