• 首页 | 期刊简介 | 编委会 | 投稿须知 | 出版道德规范 | 下载专区 | English
杜义涛,何全燕,王苗菁,仇巍*.基于双波长红外光弹的全场内部应力自动分析技术[J].实验力学,2024,39(5):647~658
基于双波长红外光弹的全场内部应力自动分析技术
Automatic full-field internal stress analysis technique based on dual-wavelength infrared photoelasticity
投稿时间:2023-11-22  修订日期:2024-01-25
DOI:10.7520/1001-4888-23-244
中文关键词:  红外光弹  双波长  半导体  内部应力  自动光弹分析
英文关键词:infrared photoelasticity  dual-wavelength  semiconductor  internal stress  automatic photoelastic analysis
基金项目:国家自然科学基金项目(12125203, 12021002, 12041201)
作者单位
杜义涛 天津大学 机械工程学院力学系, 天津 300354 
何全燕 天津大学 机械工程学院力学系, 天津 300354 
王苗菁 天津大学 机械工程学院力学系, 天津 300354 
仇巍* 1.天津大学 机械工程学院力学系, 天津 300354 2.天津市现代工程力学重点实验室, 天津 300354 
摘要点击次数: 2429
全文下载次数: 189
中文摘要:
      红外光弹法能够实现半导体材料内部应力的无损、全场表征。现有的红外光弹去包裹方法都需要一些手动干预,这成为制约红外光弹法实用于半导体应力在线检测的关键因素。本文提出了一种基于双波长红外光弹的全场内部应力自动分析技术,即双波长种子点自动识别法。该技术根据样品各点在不同波长下的相位变化趋势,解析其中所包含真实相位值的符号和绝对值信息,自动识别出相位去包裹所需要的初始种子点,从而避免了图像分析过程中的人工介入。本文围绕所提出的技术研制了双波长红外光弹实验装置,并利用该装置开展了单晶硅样品内部应力场的实验测量。将实验结果与已有方法进行对比,验证了本文提出方法及装置用于全自动分析复杂应力全场分布的可靠性。
英文摘要:
      Infrared photoelasticity method can achieve non-destructive and full-field characterization of internal stress in semiconductor materials. Most of the existing unwrapping method developed for infrared photoelasticity require some manual interventions. Lack of automated means without manual intervention is a key factor restricting the application of infrared photoelasticity to the on-line stress detection. This paper proposed an automatic full-field internal stress analysis technique based on dual-wavelength infrared photoelasticity, namely automatic seeds identification for dual wavelengths. According to the phase trend of each point in the sample at different wavelengths, the initial seeds required for phase unwrapping can be automatically identified by the symbol and absolute value of the real phase, and thus avoiding manual intervention in the whole process of photoelastic analysis. In this work, a dual-wavelength infrared photoelasticity device was developed based on the proposed technique. The results of application experiments were compared with those of other existing methods, which verified the reliability of the proposed method, and its device as well, for the automatic analysis of complex internal stress distribution.
查看全文  下载PDF阅读器
关闭

网站版权:《实验力学》编辑部
您是本站第 65990034 位访问者,今日一共访问347次,当前在线人数: 0
技术支持:本系统由北京勤云科技发展有限公司设计