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| 基于高光谱成像技术的软材料应变-反射率相关性研究 |
| Study on the strain-reflectivity correlation of soft materials based on hyperspectral imaging technology |
| Received:February 22, 2023 Revised:April 26, 2023 |
| DOI：10.7520/1001-4888-23-038 |
| 中文关键词: 硅胶 反射率 高光谱成像 |
| 英文关键词:silica gel reflectivity hyperspectral imaging |
| 基金项目:国家自然科学基金项目(11972248) |
| Author Name | Affiliation | | LUAN Hepeng | Department of Mechanical, Tianjin University, Tianjin 300350, China | | HUO Zongze | Department of Mechanical, Tianjin University, Tianjin 300350, China | | WEI Huixin | Department of Mechanical, Tianjin University, Tianjin 300350, China | | WANG Zhiyong | Department of Mechanical, Tianjin University, Tianjin 300350, China | | LI Chuanwei | Department of Mechanical, Tianjin University, Tianjin 300350, China | | LI Linan | Department of Mechanical, Tianjin University, Tianjin 300350, China | | WANG Shibin* | Department of Mechanical, Tianjin University, Tianjin 300350, China |
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| 中文摘要: |
| 基于高光谱成像技术,本文深入研究了应变对典型软材料--硅胶光谱反射率的调制作用。首先,基于托伦斯-斯派洛反射模型,建立了应变通过改变材料表面形貌进而对其光谱反射率进行调制的理论模型；其次,通过共聚焦显微镜获取不同应变状态下样品材料表面微观形貌,计算得到样品表面粗糙度,并预测了表面光谱应变-反射率比例系数；最后,利用高光谱相机实际测量了不同应变状态下材料表面的光谱反射率,结果表明,在475nm~535nm光谱波段内,压缩后硅胶的反射率随应变增大而线性减小,与理论模型预测结果吻合良好。基于本文的研究成果,有望发展一种利用反射率直接测量材料应变的实验技术。 |
| 英文摘要: |
| Based on hyperspectral imaging technology, this article delves into the modulation effect of strain on the spectral reflectivity of a typical soft material-silica gel. Firstly, based on the Torrens-Sparrow reflection model, this paper establishes a theoretical model for modulating the spectral reflectivity of materials by changing their surface morphology under strain. Secondly, the surface micromorphology of the sample material under different strain states was obtained through confocal microscopy, and its roughness was calculated, and the surface spectral strain-reflectivity ratio was predicted. Finally, the spectral reflectivity of the material surface under different stain states was measured using a hyperspectral camera. The results showed that in the spectral band range of 475nm to 535nm, the reflectivity of compressed silica gel linearly decreased with increasing strain, which is in good agreement with the predicted results of the theoretical model. Based on the research results of this article, it is expected to develop a new experimental technology that directly measures material strain using reflectivity. |
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