| 杨韶明,李树欣.用电阻应变片测量应力强度因子方法的研究[J].实验力学,1998,13(3): |
| 用电阻应变片测量应力强度因子方法的研究 |
| A METHOD FOR MEASURING MODE I STRESS INTENSITY FACTOR WITH STRAIN GAGES |
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| DOI： |
| 中文关键词: 应力强度因子,电阻应变片,断裂力学 |
| 英文关键词:stress intensity factor, strain gage technique, fracture mechanics, |
| 基金项目: |
| 杨韶明 李树欣 |
合肥工业大学(杨韶明)
，中国科学技术大学(李树欣)
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| 摘要点击次数: 244 |
| 全文下载次数: 5 |
| 中文摘要: |
| 本文利用Ｗｉｌｉａｍｓ应力函数导出的应变场渐进表达式和电阻应变片测量技术，测量张开型（Ｉ型）裂纹尖端附近两点应变来确定应力强度因子ＫＩ。通过对不同裂纹体的测试结果表明，该技术具有较好的适用性。 |
| 英文摘要: |
| A method for measuring the opening mode stress intensity factor K I with two strain gages is investigated, where the equation used for calculating the value of K I is derived from Williams stress asymptotic expansion. Comparison between the resu |
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