| Y.Morimoto,T.Matui,M.Fujigaki,Y.Yamamoto.Nano-meter Displacement Measurement by Phase Analysis of Fringe Patterns Obtained by Optical Methods[J].实验力学,2006,21(1):20~34 |
| Nano-meter Displacement Measurement by Phase Analysis of Fringe Patterns Obtained by Optical Methods |
| Nano-meter Displacement Measurement by Phase Analysis of Fringe Patterns Obtained by Optical Methods |
| 投稿时间：2005-05-08 |
| DOI： |
| 中文关键词: |
| 英文关键词:phase analysis Twyman-Green interferometry moiré interferometry phase-shifting digital holographic interferometry |
| 基金项目: |
| 作者 | 单位 | | Y.Morimoto | Faculty of Systems Engineering, Wakayama University, Wakayama 640 8510, Japan | | T.Matui | Faculty of Systems Engineering, Wakayama University, Wakayama 640 8510, Japan | | M.Fujigaki | Faculty of Systems Engineering, Wakayama University, Wakayama 640 8510, Japan | | Y.Yamamoto | Graduate School of Systems Engineering, Wakayama University, Wakayama, Japan |
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| 中文摘要: |
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| 英文摘要: |
| Optical methods such as Twyman-Green interferometry, moiré interferometry, holographic interferometry and speckle interferometry are useful to measure displacement and strain in the full-field of structures. Recently phase analysis method of fringe patterns obtained by these optical methods becomes popular, and it provides accurate quantitative results in the full-field. In this paper, in order to measure displacement and strain, real-time or high-speed nano-meter displacement measurement methods developed by the authors are introduced. That is, (1) out-of-plane displacement analysis by Twyman-Green interferometry using integrated phase-shifting method using Fourier transform phase-shifting method, (2) simultaneous two-dimensional in-plane displacement analysis by moiré interferometry and (3) out-of-plane displacement analysis by phase-shifting digital holographic interferometry. The theories and applications are shown. |
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