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何小元*,朱飞鹏,徐莹雋,史红健,王澄非,杨福俊.基于频闪栅线投影的三维微结构高频动态测试系统[J].实验力学,2011,26(5):592~602
基于频闪栅线投影的三维微结构高频动态测试系统
High-frequency 3D Dynamic Measurement System of Micro-devices based on Stroboscopic Fringe Projection
投稿时间:2011-06-06  修订日期:2011-09-13
DOI:
中文关键词:  高频频闪照明  同步控制  动态测试  栅线投影  数字图像相关
英文关键词:high-frequency stroboscopic illumination  synchronization control  dynamic measurement  fringe projection  digital image correlation
基金项目:国家自然科学基金(No. 10727201)
作者单位
何小元* 1.东南大学 工程力学系,南京 210096
2.东南大学 MEMS教育部重点实验室,南京 210096 
朱飞鹏 东南大学 工程力学系,南京 210096 
徐莹雋 东南大学 电工电子实验中心,南京 210096 
史红健 东南大学 工程力学系,南京 210096 
王澄非 东南大学 仪器科学与工程学院,南京 210096 
杨福俊 东南大学 工程力学系,南京 210096 
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中文摘要:
      在微电子机械系统(MEMS)中,执行器的动作主要通过微结构的微小变形来实现,故其动态变形测试具有十分重要的意义。本文采用栅线投影测量和频闪成像技术,研制了一套三维微结构高频动态测试系统,可以实现高达10MHz频率的动态变形测量。由于在频闪测量中,光源照明信号与器件激励信号需严格同步,本文采用直接数字频率合成和现场可编程门阵列(FPGA)技术,研制了超高频激光频闪同步控制器。通过相移栅线投影器及频闪位相控制器,获得了离面位移和背景强度,然后对背景强度运用数码图像相关技术实现面内位移的测量。
英文摘要:
      In a microelectromechanical system (MEMS), the action of actuator is implemented by tiny deformation of microstructure, so its dynamic deformation measurement is of great importance. A high-frequency up to 10MHz dynamic measurement system for 3D microstructure was developed, based on stroboscopic imaging technique and fringe projection. Since the synchronization between the stroboscopic illumination and the driving signal of specimen is required strictly, therefore, an ultra high-frequency laser stroboscopic synchronization controller was developed using both direct digital frequency synthesizer (DDS) and field-programmable gate array (FPGA). The development of fringe projector and phase-shifting controller is presented in this paper as well. Based on the proposed system, iterative phase-shifting algorithm was adopted to obtain out-of-plane displacement and background intensity. Then digital image correlation (DIC) is performed to such background intensity to determine in-plane displacement.
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